The accepted method of I.R. testing existing circuits has been to join L and N together and test to E, to protect against damaging any electronics that were inadvertently left in circuit.
However ,with the increase of new types of circuits between L and E as a result of "intentional leakage" built in to appliances , will we need to review how we carry out I.R.testing in the near future. ?
However ,with the increase of new types of circuits between L and E as a result of "intentional leakage" built in to appliances , will we need to review how we carry out I.R.testing in the near future. ?