With regards the title is the reason for this because the circuits are all in parallel?
I am talking in relation to a L/N - E test.
If Rt = global resistance for whole CU and R1, R2, R3 = L/N - E resistance for each circuit then am I right with the following:
1/Rt = 1/R1 + 1/R2 + 1/R3
So basically even if the global L/N-E IR test is < 1MΩ, that doesn't automatically mean that an individual circuit is < 1M Ω?
I am talking in relation to a L/N - E test.
If Rt = global resistance for whole CU and R1, R2, R3 = L/N - E resistance for each circuit then am I right with the following:
1/Rt = 1/R1 + 1/R2 + 1/R3
So basically even if the global L/N-E IR test is < 1MΩ, that doesn't automatically mean that an individual circuit is < 1M Ω?